Importance Measures in Reliability, Risk, and Optimization: Principles and Applications Zhu, Way Kuo; Xiaoyan Digital bok / 2018 / Engelsk
Reliability, Yield, and Stress Burn-In A Unified Approach for Microelectronics Systems Manufacturing & Software Development Way Kuo Innbundet / 1998 / Engelsk
Reliability, Yield, and Stress Burn-In A Unified Approach for Microelectronics Systems Manufacturing & Software Development Way Kuo Heftet / 2014 / Engelsk
