Radiation Effects on Embedded Systems aims at providing the reader with the major guidelines for coping with radiation effects on components supposed to be included in today’s applications devoted to operate in space, but also in the atmosphere at high altitude or at ground level. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, from 20 to 25 November 2005.

This book will provide all IC engineers with useful information regarding outside (environmental) influences on their designs and is an excellent reference.

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Radiation Effects on Embedded Systems aims at providing the reader with the major guidelines for coping with radiation effects on components supposed to be included in today’s applications devoted to operate in space, but also in the atmosphere at high altitude or at ground level.

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Radiation Space Environment.- Radiation Effects in Microelectronics.- In-flight Anomalies on Electronic Devices.- Multi-level Fault Effects Evaluation.- Effects of Radiation on Analog and Mixed-Signal Circuits.- Fundamentals of the Pulsed Laser Technique for Single-Event Upset Testing.- Design Hardening Methodologies for ASICs.- Fault Tolerance in Programmable Circuits.- Automatic Tools for Design Hardening.- Test Facilities for SEE and Dose Testing.- Error Rate Prediction of Digital Architectures: Test Methodology and Tools.- Using the SEEM Software for Laser SET Testing and Analysis.
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Radiation Effects on Embedded Systems aims at providing the reader with the major guidelines for coping with radiation effects on components supposed to be included in today’s applications devoted to operate in space, but also in the atmosphere at high altitude or at ground level. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, from 20 to 25 November 2005.

This book will provide all IC engineers with useful information regarding outside (environmental) influences on their designs and is an excellent reference.

Les mer
Provides an extensive overview of radiation effects on integrated circuits Coverage of space radiation effects Design hardening methodologies Simulation techniques of the transient effects of radiation on integrated circuits Methodology and tools for radiation ground testing on circuits and systems Qualification of circuits and systems for space applications
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GPSR Compliance The European Union's (EU) General Product Safety Regulation (GPSR) is a set of rules that requires consumer products to be safe and our obligations to ensure this. If you have any concerns about our products you can contact us on ProductSafety@springernature.com. In case Publisher is established outside the EU, the EU authorized representative is: Springer Nature Customer Service Center GmbH Europaplatz 3 69115 Heidelberg, Germany ProductSafety@springernature.com
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Produktdetaljer

ISBN
9781402056451
Publisert
2007-06-04
Utgiver
Vendor
Springer-Verlag New York Inc.
Høyde
235 mm
Bredde
155 mm
Aldersnivå
Research, P, 06
Språk
Product language
Engelsk
Format
Product format
Innbundet